DAC3482IRKDT >
DAC3482IRKDT
Texas Instruments
IC DAC 16BIT A-OUT 88WQFN
2979 Pcs New Original In Stock
16 Bit Digital to Analog Converter 2 88-WQFN-MR (9x9)
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DAC3482IRKDT Texas Instruments
5.0 / 5.0 - (162 Ratings)

DAC3482IRKDT

Product Overview

1438927

DiGi Electronics Part Number

DAC3482IRKDT-DG

Manufacturer

Texas Instruments
DAC3482IRKDT

Description

IC DAC 16BIT A-OUT 88WQFN

Inventory

2979 Pcs New Original In Stock
16 Bit Digital to Analog Converter 2 88-WQFN-MR (9x9)
Quantity
Minimum 1

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DAC3482IRKDT Technical Specifications

Category Data Acquisition, Digital to Analog Converters (DAC)

Manufacturer Texas Instruments

Packaging Cut Tape (CT) & Digi-Reel®

Series -

Product Status Active

DiGi-Electronics Programmable Not Verified

Number of Bits 16

Number of D/A Converters 2

Settling Time 10ns (Typ)

Output Type Current - Unbuffered

Differential Output Yes

Data Interface LVDS - Parallel

Reference Type External, Internal

Voltage - Supply, Analog 3.14V ~ 3.46V

Voltage - Supply, Digital 1.14V ~ 1.32V

INL/DNL (LSB) ±4, ±2

Architecture Current Source

Operating Temperature -40°C ~ 85°C

Package / Case 88-WQFN Exposed Pad

Supplier Device Package 88-WQFN-MR (9x9)

Mounting Type Surface Mount

Base Product Number DAC3482

Datasheet & Documents

HTML Datasheet

DAC3482IRKDT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
296-DAC3482IRKDTDKR
-DAC3482IRKDT-NDR
-296-28978-1-DG
296-28978-6
296-28978-6-DG
2156-DAC3482IRKDT
296-28978-2
296-DAC3482IRKDTCT
296-28978-1
296-DAC3482IRKDTTR
296-28978-2-DG
296-28978-1-DG
TEXTISDAC3482IRKDT
Standard Package
250

Alternative Parts

PART NUMBER
MANUFACTURER
QUANTITY AVAILABLE
DiGi PART NUMBER
UNIT PRICE
SUBSTITUTE TYPE
DAC3482IRKD25
Texas Instruments
729
DAC3482IRKD25-DG
0.1363
Parametric Equivalent
DAC3482IRKDR
Texas Instruments
7007
DAC3482IRKDR-DG
0.1363
Parametric Equivalent

Reviews

5.0/5.0-(Show up to 5 Ratings)
순***혼
de desembre 02, 2025
5.0
환경을 생각하는 포장 방식과 빠른 배송 덕분에 재이용 의사가 확실히 들었어요.
ひだ***まち
de desembre 02, 2025
5.0
購入後の対応も素晴らしく、安心して長く使えます。
Radi***Glow
de desembre 02, 2025
5.0
DiGi Electronics turns tech shopping into a pleasant and affordable experience.
Happ***ails
de desembre 02, 2025
5.0
Shipping is always faster than expected—greatly enhancing my shopping experience.
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Frequently Asked Questions (FAQ)

What are the key design risks when replacing the DAC3482IRKDT with a lower-cost 16-bit dual DAC like the AD9117 in a high-speed current-output application, and how can I mitigate them?

Replacing the DAC3482IRKDT with the AD9117 introduces several risks due to architectural and interface differences. The DAC3482IRKDT uses LVDS parallel input and unbuffered current output optimized for low glitch and fast settling (10ns typ), while the AD9117 uses CMOS/LVDS-selectable inputs and has different output compliance and dynamic performance. A direct drop-in replacement may cause timing mismatches, increased glitch energy, or degraded SFDR in RF applications. To mitigate, verify LVDS termination schemes match, re-evaluate output buffer requirements, and re-characterize settling time and linearity under your load conditions. Always validate with bench testing at full data rate and temperature extremes.

How does the unbuffered current output of the DAC3482IRKDT impact board layout and output stage design, especially when driving variable or capacitive loads?

The unbuffered current output of the DAC3482IRKDT requires careful output stage design because it lacks internal output amplifiers, making it sensitive to load impedance and parasitic capacitance. Driving capacitive loads (>10pF) can cause instability or ringing due to the high-impedance current source interacting with PCB parasitics. You must include a well-designed transimpedance or voltage buffer stage close to the DAC pins, use controlled-impedance traces, and minimize stubs. Additionally, ground return paths for the differential outputs must be symmetric to maintain matching and reduce EMI. Poor layout here directly impacts INL/DNL and dynamic performance, so follow TI’s reference layout and consider simulation with extracted parasitics.

Can the DAC3482IRKDT operate reliably in an industrial environment with ambient temperatures reaching 80°C, and what derating or thermal management is necessary given its 88-WQFN exposed pad package?

Yes, the DAC3482IRKDT is rated for -40°C to 85°C operation, so 80°C ambient is within spec, but thermal management is critical due to power dissipation in the 88-WQFN exposed pad package. At high data rates and full-scale output current, junction temperature can exceed safe limits without proper heatsinking. You must ensure the exposed pad is soldered to a sufficiently large thermal plane with multiple vias to inner or bottom layers. TI recommends a 4-layer board with 2 oz copper and thermal vias under the pad. Monitor TJ using θJA from the datasheet and consider airflow if power exceeds ~1W. Neglecting this can lead to thermal shutdown or long-term reliability issues due to MSL3 moisture sensitivity during assembly.

What are the pitfalls of using the internal reference of the DAC3482IRKDT versus an external precision reference like the REF5025, and how does this choice affect system-level accuracy over temperature?

While the DAC3482IRKDT includes an internal reference, relying on it introduces risks in precision applications due to its limited initial accuracy and temperature drift compared to external references like the REF5025. The internal reference may drift significantly over the -40°C to 85°C range, directly impacting gain error and system calibration stability. For high-accuracy designs (e.g., medical or test equipment), use an external low-drift, low-noise reference such as the REF5025 (2.5V, ±0.05%, 3ppm/°C) and disable the internal reference. This improves long-term stability and reduces temperature-induced errors. Always validate total system error budget including reference drift, INL, and settling behavior under dynamic conditions.

How do I ensure signal integrity when routing the LVDS parallel interface to the DAC3482IRKDT in a multi-Gbps data acquisition system, and what layout mistakes commonly cause timing failures?

Ensuring signal integrity on the LVDS parallel interface to the DAC3482IRKDT requires strict differential pair routing with matched lengths (±5mil), controlled impedance (100Ω differential), and minimal vias. Common failures stem from unmatched trace lengths causing skew, poor ground return paths increasing jitter, or proximity to noisy digital lines inducing crosstalk. Use ground shielding between LVDS pairs and avoid crossing split planes. Terminate each pair at the receiver with 100Ω resistors close to the DAC3482IRKDT pins. Also, synchronize data capture with the internal PLL and validate setup/hold times using eye diagrams at full speed. Neglecting these can lead to data corruption, increased DNL, or failed synchronization—especially critical in interleaved or multi-DAC systems.

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