CD54ACT174F3A >
CD54ACT174F3A
Texas Instruments
HEX D FLIP-FLOPS WITH RESET 16-C
1471 Pcs New Original In Stock
Flip Flop 1 Element D-Type 6 Bit Positive Edge 16-CDIP (0.300", 7.62mm)
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CD54ACT174F3A Texas Instruments
5.0 / 5.0 - (444 Ratings)

CD54ACT174F3A

Product Overview

11230548

DiGi Electronics Part Number

CD54ACT174F3A-DG

Manufacturer

Texas Instruments
CD54ACT174F3A

Description

HEX D FLIP-FLOPS WITH RESET 16-C

Inventory

1471 Pcs New Original In Stock
Flip Flop 1 Element D-Type 6 Bit Positive Edge 16-CDIP (0.300", 7.62mm)
Quantity
Minimum 1

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CD54ACT174F3A Technical Specifications

Category Logic, Flip Flops

Manufacturer Texas Instruments

Packaging -

Series 54ACT

Product Status Active

Function Master Reset

Type D-Type

Output Type Non-Inverted

Number of Elements 1

Number of Bits per Element 6

Clock Frequency 80 MHz

Max Propagation Delay @ V, Max CL 14ns @ 5V, 50pF

Trigger Type Positive Edge

Current - Output High, Low 24mA, 24mA

Voltage - Supply 4.5V ~ 5.5V

Current - Quiescent (Iq) 8 µA

Input Capacitance 10 pF

Operating Temperature -55°C ~ 125°C (TA)

Mounting Type Through Hole

Supplier Device Package 16-CDIP

Package / Case 16-CDIP (0.300", 7.62mm)

Datasheet & Documents

HTML Datasheet

CD54ACT174F3A-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) Not Applicable

Additional Information

Other Names
296-CD54ACT174F3A
Standard Package
1

Reviews

5.0/5.0-(Show up to 5 Ratings)
快***聲
de desembre 02, 2025
5.0
DiGi Electronics始終堅持高品質的標準,讓我感受到他們對細節的重視。
コ***ノ風
de desembre 02, 2025
5.0
商品詳細ページが詳しく、写真や説明文が充実していたおかげで安心して購入できました。
Blue***izon
de desembre 02, 2025
5.0
DiGi Electronics consistently provides reliable products that meet my expectations every time.
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Frequently Asked Questions (FAQ)

What are the key design-in risks when using CD54ACT174F3A in a high-noise industrial environment and how can I mitigate them?

When integrating the CD54ACT174F3A into high-noise environments, the primary risk is signal integrity degradation due to its 10 pF input capacitance and positive-edge triggering, which can make it susceptible to clock glitches. To mitigate this, use series termination resistors near the driver, implement ground plane shielding for clock and data lines, and ensure supply decoupling with a 0.1 µF ceramic capacitor at each VCC pin. Additionally, leverage the device's 24mA drive strength to interface with optoisolators or line drivers for signal isolation in electrically noisy systems.

Can CD54ACT174F3A replace CD54ACT174F3 in an existing design without layout changes, and what are the potential compatibility risks?

Yes, the CD54ACT174F3A is a direct replacement for CD54ACT174F3, with identical functionality, pinout, and timing specs. However, verify that the 'A' suffix version meets your qualification requirements—some 'A' revisions may have updated process technologies that affect parametric tolerances under extreme temperatures (-55°C to 125°C). Review TI's migration notice to confirm consistency in propagation delay (14ns @ 5V, 50pF) and setup/hold times, especially in high-frequency designs near the 80 MHz clock limit.

How does the CD54ACT174F3A compare to 74ACT174 in terms of temperature range and reliability for aerospace applications?

The CD54ACT174F3A offers a full military temperature range of -55°C to 125°C, making it more suitable for aerospace and defense applications than commercial 74ACT174 variants, which typically operate up to 85°C. The CD54ACT174F3A also undergoes more rigorous quality screening per TI's high-reliability process. For mission-critical systems, its through-hole 16-CDIP package provides better mechanical stability under thermal cycling and vibration compared to surface-mount alternatives, improving long-term reliability in harsh environments.

What are the implications of using CD54ACT174F3A near its maximum 80 MHz clock frequency with higher-than-specified load capacitance?

Operating the CD54ACT174F3A near 80 MHz with load capacitance exceeding 50pF risks violating timing margins due to increased propagation delay beyond the specified 14ns. This can cause metastability or data corruption in synchronous logic chains. To mitigate, use buffered clock distribution, minimize trace lengths, and avoid driving multiple gates directly. If higher fanout is needed, consider adding a clock buffer (e.g., CDCVF1204) to isolate the flip-flop output and maintain signal integrity under dynamic loads.

How should I handle unused D-inputs on the CD54ACT174F3A to prevent increased power consumption or instability?

Unused D-inputs on the CD54ACT174F3A must be tied to a valid logic level (either GND or VCC) via a pull-up or pull-down resistor (typically 1kΩ–10kΩ) to prevent floating inputs, which can cause oscillation and increase dynamic power consumption due to unintended switching. Never leave inputs open—even though the device has internal biasing, it's not sufficient to guarantee stable operation under EMI or temperature variations in industrial or aerospace systems.

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