ADS8405IBPFBT >
ADS8405IBPFBT
Texas Instruments
IC ADC 16BIT SAR 48TQFP
66019 Pcs New Original In Stock
16 Bit Analog to Digital Converter 1 Input 1 SAR 48-TQFP (7x7)
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ADS8405IBPFBT Texas Instruments
5.0 / 5.0 - (130 Ratings)

ADS8405IBPFBT

Product Overview

1394046

DiGi Electronics Part Number

ADS8405IBPFBT-DG

Manufacturer

Texas Instruments
ADS8405IBPFBT

Description

IC ADC 16BIT SAR 48TQFP

Inventory

66019 Pcs New Original In Stock
16 Bit Analog to Digital Converter 1 Input 1 SAR 48-TQFP (7x7)
Quantity
Minimum 1

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In Stock (All prices are in USD)
  • QTY Target Price Total Price
  • 1 24.6492 24.6492
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ADS8405IBPFBT Technical Specifications

Category Data Acquisition, Analog to Digital Converters (ADC)

Manufacturer Texas Instruments

Packaging Cut Tape (CT) & Digi-Reel®

Series microPOWER™

Product Status Active

Number of Bits 16

Sampling Rate (Per Second) 1.25M

Number of Inputs 1

Input Type Pseudo-Differential

Data Interface Parallel

Configuration S/H-ADC

Ratio - S/H:ADC 1:1

Number of A/D Converters 1

Architecture SAR

Reference Type External, Internal

Voltage - Supply, Analog 5V

Voltage - Supply, Digital 2.7V ~ 5.25V

Features -

Operating Temperature -40°C ~ 85°C

Package / Case 48-TQFP

Supplier Device Package 48-TQFP (7x7)

Mounting Type Surface Mount

Base Product Number ADS8405

Datasheet & Documents

HTML Datasheet

ADS8405IBPFBT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 2 (1 Year)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
-296-17636-1-NDR
2156-ADS8405IBPFBT
-296-17636-1-DG
296-17636-2-NDR
-296-17636-1
-ADS8405IBPFBTG4-NDR
296-17636-6
TEXTISADS8405IBPFBT
-ADS8405IBPFBT-NDR
296-17636-2
296-17636-1-NDR
296-17636-1
-ADS8405IBPFBTG4
Standard Package
250

Alternative Parts

PART NUMBER
MANUFACTURER
QUANTITY AVAILABLE
DiGi PART NUMBER
UNIT PRICE
SUBSTITUTE TYPE
ADS8405IPFBR
Texas Instruments
1058
ADS8405IPFBR-DG
0.2465
Parametric Equivalent
ADS8401IBPFBT
Texas Instruments
859
ADS8401IBPFBT-DG
0.2465
MFR Recommended
ADS8405IBPFBTG4
Texas Instruments
1129
ADS8405IBPFBTG4-DG
0.2465
MFR Recommended
ADS8405IBPFBR
Texas Instruments
851
ADS8405IBPFBR-DG
0.2465
Parametric Equivalent

Reviews

5.0/5.0-(Show up to 5 Ratings)
Brig***eacon
de desembre 02, 2025
5.0
Their punctuality in dispatching orders helps me keep my repair shop running smoothly without delays.
Vib***aft
de desembre 02, 2025
5.0
The speed of their delivery service is excellent; I receive my products in record time, and they are always packaged securely.
Sof***eeze
de desembre 02, 2025
5.0
Quick turnaround on shipping; support staff went above and beyond.
Velve***yline
de desembre 02, 2025
5.0
The staff are approachable and always ready to offer helpful advice.
Light***veler
de desembre 02, 2025
5.0
Their competitive pricing and quick support after purchase make buying from DiGi Electronics a win-win.
Wond***eeker
de desembre 02, 2025
5.0
I am continually satisfied with the quality and reliability of their offerings.
Morn***Bliss
de desembre 02, 2025
5.0
Their after-sales team follows up to ensure I am happy with my experience, which is excellent.
Maple***tique
de desembre 02, 2025
5.0
I am impressed with their ability to deliver solutions as quickly as possible.
Myst***ingle
de desembre 02, 2025
5.0
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Frequently Asked Questions (FAQ)

How does the ADS8405IBPFBT perform in high-noise industrial environments when using pseudo-differential inputs, and what layout practices minimize signal integrity risks?

The ADS8405IBPFBT's pseudo-differential input architecture provides moderate noise rejection in electrically noisy industrial settings, but designers must take care to minimize ground shifts and noise coupling on the analog input node. Because only the positive input is actively sampled while the negative input is fixed (typically to a reference or ground), common-mode noise rejection is limited compared to true differential ADCs. To ensure reliable performance, use a solid low-impedance analog ground plane, route the analog input signals as single-ended with tight coupling to AGND, and minimize trace lengths to reduce pickup. Additionally, placing a small RC filter (e.g., 10 Ω in series with 100 pF to ground) at the ADC input can reduce high-frequency noise without significantly affecting the 1.25MSPS sampling rate. Shielding sensitive traces and using star grounding techniques further improve signal integrity in high-noise environments.

Can I replace the ADS8405IBPFBT with the ADS8588S in a legacy design without changing my interface logic levels and supply configuration?

No, replacing the ADS8405IBPFBT with the ADS8588S introduces significant compatibility risks due to differences in voltage levels and interface architecture. The ADS8405IBPFBT supports digital supplies from 2.7V to 5.25V, allowing direct interfacing with both 3.3V and 5V logic systems via its parallel interface. In contrast, the ADS8588S requires a separate 1.8V DVDD and uses SPI, making it incompatible with your existing parallel control lines and timing. Additionally, the ADS8588S operates with true differential inputs, so analog front-end signal conditioning would also need redesign. If you're seeking a pin-compatible upgrade with similar parallel output, consider the ADS8403IBPF, which maintains the same 48-TQFP footprint and supply range.

What are the risks of relying on the internal reference in the ADS8405IBPFBT in a precision measurement system operating across the full temperature range?

Relying solely on the internal reference of the ADS8405IBPFBT in precision applications across the -40°C to 85°C range introduces accuracy risks due to uncontrolled drift and sensitivity to supply noise. While the internal reference simplifies design by eliminating an external component, its typical drift is ±10% over temperature and it lacks the stability of precision external references like the REF5025. In systems requiring better than ±0.1% total error, this variation can dominate total system error, especially when combined with INL and gain drift. For high-precision use, it's strongly recommended to bypass the internal reference and drive the REFIN pin with a low-noise, high-stability external reference. This upgrade improves long-term reliability and reduces temperature-induced measurement errors, particularly in weighing or sensor-multiplexed data acquisition systems.

How does the SAR architecture of the ADS8405IBPFBT impact its suitability for multiplexed multi-channel measurements compared to sigma-delta ADCs?

The SAR-based ADS8405IBPFBT is well-suited for fast, medium-to-high precision multiplexed measurements because it offers no-latency conversion and fast settling time, unlike sigma-delta ADCs which introduce digital filtering delays. However, since the ADS8405IBPFBT is a single-channel 16-bit SAR ADC, managing multiplexed inputs requires careful timing between channel switching and acquisition. The main risk is insufficient settling time for the internal sampling capacitor when switching between high-impedance sources. To mitigate this, ensure your multiplexer settles fully before enabling CONVST, use low-output-impedance signal conditioning (e.g., op-amps like OPA2350), and consider extending the acquisition window via external timing control. This makes the ADS8405IBPFBT more predictable than sigma-deltas in real-time control loops but demands tighter board-level signal chain design.

What are the long-term reliability concerns when the ADS8405IBPFBT is used near its maximum 1.25MSPS sampling rate in a thermally constrained space?

Operating the ADS8405IBPFBT near its 1.25MSPS maximum rate in a thermally constrained environment increases junction temperature, which can accelerate parametric drift and reduce long-term reliability. At high throughput, the internal sampling capacitor charges more frequently, increasing dynamic power dissipation. Even though the device is in a microPOWER™ series, poor PCB thermal design—such as insufficient copper pour or missing thermal vias—can lead to localized heating in the 48-TQFP package. This may shift offset, gain, and INL performance over time. To mitigate risk, reduce effective sampling rate when full bandwidth isn’t needed, use ground planes for heat spreading, and simulate junction temperature with worst-case ambient and power conditions. Additionally, perform accelerated life testing if the product is expected to operate above 70°C ambient for extended durations.

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