ADS5281IRGCT >
ADS5281IRGCT
Texas Instruments
IC ADC 12BIT PIPELINED 64VQFN
2211 Pcs New Original In Stock
12 Bit Analog to Digital Converter 8 Input 8 Pipelined 64-VQFN (9x9)
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ADS5281IRGCT Texas Instruments
5.0 / 5.0 - (73 Ratings)

ADS5281IRGCT

Product Overview

1381329

DiGi Electronics Part Number

ADS5281IRGCT-DG

Manufacturer

Texas Instruments
ADS5281IRGCT

Description

IC ADC 12BIT PIPELINED 64VQFN

Inventory

2211 Pcs New Original In Stock
12 Bit Analog to Digital Converter 8 Input 8 Pipelined 64-VQFN (9x9)
Quantity
Minimum 1

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  • 1 137.8377 137.8377
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ADS5281IRGCT Technical Specifications

Category Data Acquisition, Analog to Digital Converters (ADC)

Manufacturer Texas Instruments

Packaging Cut Tape (CT) & Digi-Reel®

Series -

Product Status Active

Number of Bits 12

Sampling Rate (Per Second) 50M

Number of Inputs 8

Input Type Differential

Data Interface LVDS - Serial, SPI

Configuration S/H-ADC

Ratio - S/H:ADC 1:1

Number of A/D Converters 8

Architecture Pipelined

Reference Type External, Internal

Voltage - Supply, Analog 3V ~ 3.6V

Voltage - Supply, Digital 1.7V ~ 1.9V

Features Simultaneous Sampling

Operating Temperature -40°C ~ 85°C

Package / Case 64-VFQFN Exposed Pad

Supplier Device Package 64-VQFN (9x9)

Mounting Type Surface Mount

Base Product Number ADS5281

Datasheet & Documents

Manufacturer Product Page

ADS5281IRGCT Specifications

HTML Datasheet

ADS5281IRGCT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
ADS5281IRGCTG4
296-23307-6-NDR
-ADS5281IRGCT-NDR
296-23307-1-NDR
-ADS5281IRGCTG4
296-23307-6
296-23307-2
-ADS5281IRGCTG4-NDR
-296-23307-1-NDR
296-23307-1
296-23307-2-NDR
-296-23307-1-DG
ADS5281IRGCTG4-DG
Standard Package
250

Alternative Parts

PART NUMBER
MANUFACTURER
QUANTITY AVAILABLE
DiGi PART NUMBER
UNIT PRICE
SUBSTITUTE TYPE
ADS5281IRGCR
Texas Instruments
1804
ADS5281IRGCR-DG
1.3784
Parametric Equivalent

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5.0/5.0-(Show up to 5 Ratings)
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Frequently Asked Questions (FAQ)

Can the ADS5281IRGCT be safely used in a multi-board system where analog and digital grounds are separated, and how should I handle the exposed pad and LVDS return paths to avoid ground loops or noise coupling?

Yes, the ADS5281IRGCT can be used in split-ground systems, but careful layout is critical. The exposed pad must be connected to the analog ground plane with multiple vias to ensure thermal and electrical stability, as it is internally bonded to the analog ground. For LVDS signals, maintain a continuous reference plane (preferably analog ground) beneath the differential pairs and avoid crossing ground splits. Use a single-point ground connection between analog and digital grounds near the power supply to minimize ground loops. Failure to properly manage return currents can lead to increased jitter and SNR degradation, especially at 50 MSPS.

What are the key risks when replacing the ADS5281IRGCT with a lower-cost 12-bit ADC like the AD9230BCPZ-50 in an 8-channel simultaneous sampling application, and how do their input architectures differ in real-world performance?

Replacing the ADS5281IRGCT with the AD9230BCPZ-50 introduces significant functional and performance risks. The ADS5281IRGCT features true simultaneous sampling across all 8 channels via individual sample-and-hold circuits (1:1 S/H:ADC ratio), while the AD9230BCPZ-50 is a single-channel ADC requiring external multiplexing, introducing channel-to-channel skew and timing uncertainty. Additionally, the AD9230 lacks integrated LVDS outputs and requires separate level translation, increasing design complexity and noise susceptibility. In time-synchronized applications like beamforming or power monitoring, this skew can cause measurement errors exceeding 1 LSB, making the substitution unsuitable despite similar nominal resolution and speed.

How does the internal reference of the ADS5281IRGCT compare to using a high-precision external reference like the REF5025 in terms of long-term drift and system calibration overhead, and when is each approach justified?

The ADS5281IRGCT’s internal reference is convenient but has higher drift (~30 ppm/°C typical) compared to the REF5025 (~3 ppm/°C). In temperature-varying environments or high-accuracy applications (e.g., medical instrumentation or precision test equipment), using the REF5025 with the ADS5281IRGCT’s external reference mode reduces gain error drift by an order of magnitude. However, this adds cost, board space, and requires careful decoupling and layout. If your system undergoes periodic calibration or operates in a stable thermal environment, the internal reference may suffice. For mission-critical measurements without frequent recalibration, the external reference is strongly recommended to maintain accuracy over time and temperature.

What layout and decoupling strategies are essential to maintain SNR performance when routing the 8 differential analog inputs of the ADS5281IRGCT on a 4-layer PCB with mixed digital signals nearby?

To preserve SNR on the ADS5281IRGCT, route all 8 differential analog input pairs as tightly coupled, length-matched microstrips on an inner layer with a solid analog ground plane directly beneath. Maintain at least 3x trace width spacing from digital signals (especially SPI or clock lines) to minimize crosstalk. Use individual 10 nF + 1 µF ceramic capacitors at each analog supply pin (AVDD), placed as close as possible to the pins, with a single bulk capacitor (10 µF) near the package. Avoid vias in the signal path, and ensure the digital return currents do not flow under the analog input traces. Poor decoupling or improper routing can degrade SNR by 6–10 dB, particularly at higher input frequencies near the Nyquist limit.

Is the ADS5281IRGCT suitable for operation in an industrial motor drive environment with high EMI, and what additional filtering or shielding techniques are needed to ensure reliable 12-bit performance?

The ADS5281IRGCT can be used in industrial motor drive environments, but requires robust EMI mitigation due to its high-speed LVDS interface and sensitive analog front-end. Implement π-filters or RC low-pass filters (cutoff ~10 MHz) on each analog input to suppress high-frequency noise from PWM sources. Enclose the ADC and input circuitry in a grounded metal shield, and use common-mode chokes on LVDS lines if routing over long distances. Ensure the 1.8V digital supply is clean and isolated from noisy digital rails using an LDO with good PSRR. Without these measures, conducted and radiated EMI can introduce spurious tones or increase DNL errors, compromising effective resolution in current sensing or encoder feedback applications.

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