ADS114S06BIRHBT >
ADS114S06BIRHBT
Texas Instruments
IC ADC 16BIT SIGMA-DELTA 32VQFN
29605 Pcs New Original In Stock
16 Bit Analog to Digital Converter 4, 6 Input 1 Sigma-Delta 32-VQFN (5x5)
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ADS114S06BIRHBT Texas Instruments
5.0 / 5.0 - (465 Ratings)

ADS114S06BIRHBT

Product Overview

1256656

DiGi Electronics Part Number

ADS114S06BIRHBT-DG

Manufacturer

Texas Instruments
ADS114S06BIRHBT

Description

IC ADC 16BIT SIGMA-DELTA 32VQFN

Inventory

29605 Pcs New Original In Stock
16 Bit Analog to Digital Converter 4, 6 Input 1 Sigma-Delta 32-VQFN (5x5)
Quantity
Minimum 1

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In Stock (All prices are in USD)
  • QTY Target Price Total Price
  • 1 71.3213 71.3213
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ADS114S06BIRHBT Technical Specifications

Category Data Acquisition, Analog to Digital Converters (ADC)

Manufacturer Texas Instruments

Packaging Cut Tape (CT) & Digi-Reel®

Series -

Product Status Active

Number of Bits 16

Sampling Rate (Per Second) 4k

Number of Inputs 4, 6

Input Type Differential, Pseudo-Differential, Single Ended

Data Interface SPI

Configuration MUX-PGA-ADC

Ratio - S/H:ADC -

Number of A/D Converters 1

Architecture Sigma-Delta

Reference Type External, Internal

Voltage - Supply, Analog ±2.5V, 2.7V ~ 5.25V

Voltage - Supply, Digital 2.7V ~ 3.6V

Features PGA, Temperature Sensor

Operating Temperature -40°C ~ 125°C (TA)

Package / Case 32-VFQFN Exposed Pad

Supplier Device Package 32-VQFN (5x5)

Mounting Type Surface Mount

Base Product Number ADS114S06

Datasheet & Documents

Manufacturer Product Page

ADS114S06BIRHBT Specifications

HTML Datasheet

ADS114S06BIRHBT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
296-47423-6
2156-ADS114S06BIRHBT
296-47423-1
296-47423-2
TEXTISADS114S06BIRHBT
Standard Package
250

Alternative Parts

PART NUMBER
MANUFACTURER
QUANTITY AVAILABLE
DiGi PART NUMBER
UNIT PRICE
SUBSTITUTE TYPE
ADS114S06BIRHBR
Texas Instruments
1038
ADS114S06BIRHBR-DG
0.7132
Parametric Equivalent

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Frequently Asked Questions (FAQ)

Can the ADS114S06BIRHBT be safely used in a 5V industrial sensor interface where the analog supply is 5V but the microcontroller runs on 3.3V logic?

Yes, the ADS114S06BIRHBT supports a digital supply voltage (DVDD) range of 2.7V to 3.6V and an analog supply (AVDD) range of 2.7V to 5.25V, allowing it to interface directly with 3.3V microcontrollers while powering analog front-end circuits at 5V. However, ensure that the SPI signals from the MCU do not exceed DVDD + 0.3V; if the MCU outputs 5V logic, use level-shifting circuitry or configure the MCU pins for 3.3V I/O to avoid damaging the ADC’s digital inputs.

What are the key risks when replacing the ADS114S06BIRHBT with a lower-cost 16-bit sigma-delta ADC like the ADS1115 in a precision thermocouple measurement system?

Replacing the ADS114S06BIRHBT with the ADS1115 introduces significant performance trade-offs: the ADS1115 lacks an integrated PGA with high input impedance, has only 4kSPS max throughput vs. the ADS114S06BIRHBT’s flexible data rates up to 4kSPS with better noise performance, and offers no internal temperature sensor for cold-junction compensation. Additionally, the ADS1115 uses a smaller package without an exposed pad, reducing thermal dissipation capability. In high-precision or high-temperature environments, these omissions can lead to measurement drift, reduced accuracy, and reliability issues—making the ADS114S06BIRHBT a superior choice for demanding thermocouple applications.

How should I handle grounding and layout for the ADS114S06BIRHBT’s exposed thermal pad in a mixed-signal PCB design to minimize noise coupling?

The ADS114S06BIRHBT’s 32-VQFN exposed pad must be connected directly to a clean analog ground (AGND) plane using multiple vias to ensure low-impedance thermal and electrical connection. Avoid routing digital signals or high-speed traces under the package. Split the ground plane only if absolutely necessary—prefer a single, solid ground plane with careful partitioning of analog and digital return currents. Place decoupling capacitors (100nF ceramic + 10µF tantalum) as close as possible to AVDD and DVDD pins, referencing the same AGND node connected to the thermal pad. Poor grounding here can elevate noise floor and degrade effective resolution in low-level signal measurements.

Is the internal reference of the ADS114S06BIRHBT stable enough for long-term strain gauge measurements without periodic recalibration, or should I use an external reference like the REF5025?

While the ADS114S06BIRHBT includes an internal reference, its long-term drift and temperature coefficient may not meet the stability requirements for precision strain gauge applications over wide temperature ranges or extended durations. For critical measurements, TI recommends using a high-stability external reference such as the REF5025 (2.5V, ±0.05% initial accuracy, 3ppm/°C drift). The ADS114S06BIRHBT supports external references via the VREFP pin, allowing you to bypass the internal reference and achieve sub-0.01% system accuracy. This is especially important in bridge-based sensors where reference drift directly translates to measurement error.

Can the ADS114S06BIRHBT operate reliably in an automotive under-hood environment given its -40°C to 125°C rating, and what derating considerations apply for continuous operation near 125°C?

The ADS114S06BIRHBT is rated for operation up to 125°C ambient (TA), making it suitable for many automotive under-hood applications. However, continuous operation near the upper limit requires careful thermal management: power dissipation increases with supply voltage and sampling rate, and junction temperature can exceed TA by 20–30°C depending on PCB layout. Derate performance parameters such as SNR and offset drift at elevated temperatures—consult Figure 12 in the datasheet for drift vs. temperature. Ensure adequate copper area connected to the exposed pad and avoid stacking heat-generating components nearby. For mission-critical systems, consider periodic self-calibration or margin testing to validate long-term reliability under thermal stress.

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